Research > Facilities > Electron microscopy
Instrumentation
JEOL – JEM 1400. 120 keV accelerating voltage; electron gun assembly with cool beam illumination system - LaB6 filament. Point resolution: 0.38 nm; Lattice resolution: 0.20 nm; Accelerating voltage range: 40, 60, 80, 100, 120 keV; equipped with energy dispersive spectroscopy.
The Department of Engineering also has a FEI Quanta 450FEG SEM; click here for details. |
Facility Manager
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Access and Training
Send an email request to dstrongi@temple.edu for information about scheduling
